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Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76
Figure 1: Details of the NC-AFM measuring head in a front and side view showing the interferometric setup wit...
Figure 2: Schematic representation of the interferometer setup, signal path and cavity parameters. Signal pow...
Figure 3: Schematic representation of three common types of misalignment of fiber and cantilever; (a) lateral...
Figure 4: Schematic representation of the interferometer signal Psig as a function of the fiber–cantilever di...
Figure 5: Signal power over distance measurements for three differently positioned cantilevers. Cantilever 1 ...
Figure 6: Lateral interference patterns for cantilever 4 scanned by the fiber-positioning piezo for (a) Fabry...
Figure 7: Interference patterns for cantilever 4 generated from the 3D intensity map data for (a,d) Fabry–Pér...
Figure 8: Interferometer signal power Psig of the main maximum (black) and a side maximum (gray) measured for...
Figure 9: Displacement spectral density of the noise floor of the interferometer signal as a function of the...